Knowledge Management System Of Guangzhou Institute of Energy Conversion, CAS
Surface morphology and defects of polycrystalline silicon thin film | |
Hu YF(胡芸菲); Guo ZQ(郭志球); Liu XY(柳锡运) | |
2010-08-06 | |
Source Publication | 15th International Photovoltaic Science and Engineering Conference ; 15th International Photovoltaic Science and Engineering Conference |
Source Publication | 15th International Photovoltaic Science and Engineering Conference ; 15th International Photovoltaic Science and Engineering Conference |
Conference Date | 2005 |
Conference Place | - |
Document Type | 会议论文 |
Identifier | http://ir.giec.ac.cn/handle/344007/3189 |
Collection | 中国科学院广州能源研究所 |
Recommended Citation GB/T 7714 | Hu YF,Guo ZQ,Liu XY. Surface morphology and defects of polycrystalline silicon thin film[C],2010. |
Files in This Item: | Download All | |||||
File Name/Size | DocType | Version | Access | License | ||
Surface Morphology a(499KB) | 开放获取 | -- | View Download |
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