Knowledge Management System Of Guangzhou Institute of Energy Conversion, CAS
Thickness-Dependent Structural and Optical Properties of VO2 Thin Films | |
Ma, Jianwei1,2; Xu, Gang1; Miao, Lei1; Tazawa, Masato3; Tanemura, Sakae4 | |
2011-02-01 | |
Source Publication | JAPANESE JOURNAL OF APPLIED PHYSICS
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Volume | 50Issue:2 |
Abstract | VO2 thin films with thicknesses from 100 to 2 nm were prepared on C-plane sapphire (0001) substrates by magnetron sputtering and remarkable thickness-dependent structural and optical properties were found. Below 10 nm, the films are nonconductive, island structured, and their phase transition temperatures are reduced to be much lower than those of the continuous, thick films. Structural defects in the island crystal films may be one of the main reasons for this temperature reduction. The film growth mode was identified to be the Vollmer-Weber (island growth)-type in the initial stage. (C) 2011 The Japan Society of Applied Physics |
Subtype | Article |
WOS Headings | Science & Technology ; Physical Sciences |
DOI | 10.1143/JJAP.50.020215 |
WOS Subject Extended | Physics |
WOS Keyword | METAL PHASE-TRANSITION ; VANADIUM DIOXIDE ; INSULATOR-TRANSITION ; RAMAN-SCATTERING ; SEMICONDUCTOR ; TEMPERATURE |
Indexed By | SCI |
Language | 英语 |
WOS Subject | Physics, Applied |
WOS ID | WOS:000287525300015 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.giec.ac.cn/handle/344007/10405 |
Collection | 中国科学院广州能源研究所 |
Affiliation | 1.Chinese Acad Sci, Guangzhou Inst Energy Convers, Key Lab Renewable Energy & Gas Hydrate, Guangzhou 510640, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China 3.Natl Inst Adv Ind Sci & Technol, Nagoya, Aichi 4638560, Japan 4.Japan Fine Ceram Ctr, Dept Mat Sci & Engn, Nagoya, Aichi 4568587, Japan |
Recommended Citation GB/T 7714 | Ma, Jianwei,Xu, Gang,Miao, Lei,et al. Thickness-Dependent Structural and Optical Properties of VO2 Thin Films[J]. JAPANESE JOURNAL OF APPLIED PHYSICS,2011,50(2). |
APA | Ma, Jianwei,Xu, Gang,Miao, Lei,Tazawa, Masato,&Tanemura, Sakae.(2011).Thickness-Dependent Structural and Optical Properties of VO2 Thin Films.JAPANESE JOURNAL OF APPLIED PHYSICS,50(2). |
MLA | Ma, Jianwei,et al."Thickness-Dependent Structural and Optical Properties of VO2 Thin Films".JAPANESE JOURNAL OF APPLIED PHYSICS 50.2(2011). |
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